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Ion Diffusion-Induced Multi-Interface Reconstruction for High-Resolution Perovskite X-Ray Flat-Panel Detectors.

Created on 05 Aug 2026

Authors

Yingjun Chai, Xiangyu Ou, Dingshuo Zhang, Yu Gu, Xi Qin, Ankang Li, Zhicheng Wang, Xudong Hu, Xingliang Dai, Feng Gao, Xiaoming Li

Published in

Advanced materials (Deerfield Beach, Fla.). Pages e74479. Aug 05, 2026. Epub Aug 05, 2026.

Abstract

A critical challenge with state-of-the-art perovskite x-ray flat-panel detectors (FPDs) is their limited spatial resolution, primarily due to the presence of multiple poorly integrated interfaces. In this study, we report high-resolution perovskite FPDs that achieve a record modulation transfer function (MTF) among polycrystalline perovskite direct-conversion x-ray FPDs of 6.2 line pairs per millimetre (lp mm-1) with a large imaging area of 8.5 × 8.5 cm2 through an interface reconstruction strategy specifically tailored for perovskites. We reveal that Fick's law-guided ion diffusion across hundreds of microns-thick perovskites contributes to a reconstructed x-ray sensing layer with highly integrated interfaces and a gradient energy band alignment. As such, we have realized an ultrasensitive x-ray detection with a leading sensitivity-to-dark current ratio (2.61 × 1011 µC Gyair -1 A-1) and outstanding stability under ambient conditions over 5760 h. The prototype perovskite FPDs exhibit a detective quantum efficiency (76.9%) and enable high-resolution x-ray imaging at a low dosage (0.98 µGyair), substantially lower than previous polycrystalline perovskite FPDs. Our multi-interface reconstruction strategy successfully addresses long-standing issues in perovskite FPDs, advancing their progress from laboratory prototypes to commercial applications in digital radiography and industrial inspection.

PMID:
42554432
Bibliographic data and abstract were imported from PubMed on 05 Aug 2026.

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