[Atrioventricular block after percutaneous closure of an ostium secundum-type atrial septal defect with Nit-Occlud devices].

Authors

Alejandro E Contreras, Alejandro R Peirone, Facundo Ledesma, Ernesto Juaneda, Víctor Defago, Eduardo Cuestas

Published in

Medicina. Volume 86. Issue 4. Pages 876-884.

Abstract

Percutaneous treatment is currently the method of choice for ostium secundum atrial septal defects (OS-ASD) treatment. However, this procedure may be associated with an increased incidence of atrioventricular block. The incidence of these events could be related to the design of the device used.
This study featured a retrospective and analytical design. Consecutive patients with OS-ASD who underwent percutaneous treatment between July 2020 and June 2025 were included. The presence of a new atrioventricular conduction block (AVB) of any degree, was classified as an adverse effect.
A total of 157 patients were included, with a median age of 8 years (5-15 years). Implantation was successful in 98.7% of patients. Three patients (1.9%) experienced AVB. Two cases were first-degree AVB, which resolved at 6 and 60 days respectively, and one was complete AVB, which resolved upon device removal. Multivariate logistic regression analysis determined that the size of the implanted device waist (OR 1.39 IC 95% 1.11- 1.97; p= 0.04) was independently associated with AVB.
The prevalence of AVB after percutaneous treatment of OS-ASD with Nit-Occlud devices is rare. Devices with larger waist diameters were associated with a higher risk of AVB.

PMID:
42604497
Bibliographic data and abstract were imported from PubMed on 17 Aug 2026.

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