Hiring in life sciences? Share your open positions with our professional community. Read more Close

Advertisement

Anchored Oxygen-Release-Suppression Phase Stabilizing High-Voltage Ni-Rich Cathode Materials.

Created on 24 Aug 2026

Authors

Ziqi Liu, Yiming Zhang, Yong Chen, Meng Yao, Yangyang Wang, Du Yuan, Haitao Zhang, Yun Zhang, Guoxiu Wang

Published in

Angewandte Chemie (International ed. in English). Pages e9916183. Aug 23, 2026. Epub Aug 23, 2026.

Abstract

The Ni-rich LiNixCoyMn1-x-yO2 (x ≥ 0.9) cathode materials (NCMs) have been considered promising for next-generation Li-ion batteries owing to their high-energy density. However, their practical application is hindered by gas evolution and rapid capacity degradation, primarily caused by irreversible oxygen release and structural instability. Herein, a facile one-step anchoring strategy is proposed to overcome this challenge by engineering a precisely tailored dual-architecture LiNi0.9Co0.05Mn0.05O2 (DA-NCM). This strategy constructs a dual-phase surface architecture on Ni-rich cathodes, where perovskite-phase La4LiNiO8 mitigates surface oxygen instability and interfacial degradation, and inert La2Mo2O9 anchors the lattice to avoid the detachment of La4LiNiO8 during cycling via enhanced La─O bond pinning effect. This dual-architecture design provides a robust strategy for stabilizing the interface, surface, and bulk phase of Ni-rich cathodes, enabling durable oxygen regulation, suppressed structural degradation, and stable high-voltage operation under demanding cycling conditions. Thus, our DA-NCM cathodes demonstrate excellent capacity retention of 95.7% at 4.3 V and 93.6% at 4.5 V after 200 cycles and remarkable stability even at an elevated temperature (50°C) and high voltage (4.5 V), confirming their markedly enhanced electrochemical stability. This precision design of dual architecture provides a new pathway for developing high-energy-density cathode materials with long cycle life.

PMID:
42633673
Bibliographic data and abstract were imported from PubMed on 24 Aug 2026.

Read full publication at:
Please sign in to see all details.

Advertisement

Stats

  • Community rating n/a 0 votes
  • Reviewers' rating n/a 0 votes
  • Your rating

1-terrible, 9-excellent. How would you rate this publication? Sign in in to submit your rating.

  • Recommendations n/a n/a positive of 0 vote(s)
  • Views 9
  • Comments 0

Recommended by

  • No recommendations yet.

Post a comment

You need to be signed in to post comments. You can sign in here.

Comments

There are no comments yet.

Advertisement