Hiring in life sciences? Share your open positions with our professional community. Read more Close

Advertisement

Accurate (n,m) Assignment of Single-Walled Carbon Nanotubes From Electron Diffraction Patterns Via Local Candidate Search and Self-Consistency Correction.

Created on 17 Sep 2026

Authors

Hirotaka Inoue, Hua Jiang, Rui Iwasaki, Anastasios Karakassides, Toshihiko Fujimori, Esko I Kauppinen

Published in

Small methods. Pages e71039. Sep 16, 2026. Epub Sep 16, 2026.

Abstract

The chirality (n,m) of single-walled carbon nanotubes (SWCNTs) critically governs their properties and growth behavior, yet reliable assignment from nanobeam electron diffraction (NBED) remains challenging because of analyst-dependent procedures, manual measurement errors, and nanotube tilt relative to the incident electron beam. Here, a practical and interpretable chirality-assignment protocol is developed by extending a calibration-free diffraction-analysis framework with local candidate search and self-consistency-based cross-check correction. Feature extraction and candidate screening are semiautomated using an ImageJ script and an Excel VBA macro to improve efficiency and reproducibility. The protocol is evaluated using 2394 simulated NBED images spanning diameters of 0.48-2.3 nm, chiral angles of 0°-30°, and tilt angles of 0.5°-16.5°. The exact assignment accuracy increases from 71.6% with conventional TRUNC-based analysis to 97.7% with the proposed protocol, while errors in the mean diameter, mean chiral angle, and metallic SWCNT fraction are substantially reduced. The improvement is mainly enabled by the newly introduced overlap ratio, which serves as the primary criterion for final candidate ranking. This error-resilient workflow provides a reproducible route for extracting reliable structural information from experimentally imperfect diffraction patterns without requiring instrument calibration or data-driven model training.

PMID:
42750382
Bibliographic data and abstract were imported from PubMed on 17 Sep 2026.

Read full publication at:
Please sign in to see all details.

Advertisement

Stats

  • Community rating n/a 0 votes
  • Reviewers' rating n/a 0 votes
  • Your rating

1-terrible, 9-excellent. How would you rate this publication? Sign in in to submit your rating.

  • Recommendations n/a n/a positive of 0 vote(s)
  • Views 6
  • Comments 0

Recommended by

  • No recommendations yet.

Post a comment

You need to be signed in to post comments. You can sign in here.

Comments

There are no comments yet.

Advertisement