Authors
M W Lee, Soobin Lim, Ji Hwan Kim, G W Nam, Jongmin Lee, Chan-Hwi Jeon, Y S Hwang, C Sung
Published in
The Review of scientific instruments. Volume 97. Issue 10. Oct 01, 2026.
Abstract
The two-filter soft x-ray (SXR) method has been widely used to infer the electron temperature (Te) in keV-scale fusion plasmas, but its application in the sub-100 eV regime has been relatively less explored. For application in this regime, several additional effects require consideration. This work assesses the two-filter SXR method to infer Te in the sub-100 eV regime using the Be/Al filter configuration of the versatile experiment spherical torus SXR arrays. In this process, the relevant effects are separated into two categories. Random uncertainty components, namely, the filter-thickness fabrication tolerance and detector noise, are propagated through the ratio-temperature response curve to quantify the uncertainty. Systematic effects, namely, native oxide layers on the filters and impurity line emission, modify the response and are incorporated into the response calculation. Overall, the results indicate that the various random and systematic effects must be properly accounted for to achieve two-filter Te measurements in the sub-100 eV regime.
PMID:
42853015
Bibliographic data and abstract were imported from PubMed on 09 Oct 2026.
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