Extending the Computable Depth Range in Electron Ptychography using Event-Converted Data.

Authors

Kazutaka Mitsuishi, Masahiko Shimizu, Katsuaki Nakazawa, Masaki Takeguchi, Ayako Hashimoto, Toshiaki Tanigaki

Published in

Microscopy (Oxford, England). Oct 13, 2026. Epub Oct 13, 2026.

Abstract

Iterative multislice electron ptychography enables depth sectioning but its range is constrained by the real-space patch imposed by detector sampling. Reconstruction using converted 4D-STEM patterns into electron-event lists decouples the model's reciprocal-space sampling interval from detector pixels size, reducing data volume, and enabling event-based loss function evaluation. The effect of patch size to the computable depth range, and the validity of the proposed method were demonstrated by simulation. The experimental demonstration on SSZ-13 zeolite shows improved reconstruction quality with preserved depth profiles; under 4× detector binning, reconstruction quality and depth sectioning are retained by selecting a finer reciprocal-space sampling interval, thereby extending the computable depth range without sacrificing angular coverage.

PMID:
42870398
Bibliographic data and abstract were imported from PubMed on 14 Oct 2026.

Read full publication at:
Please sign in to see all details.

Stats

1-terrible, 9-excellent. How would you rate this publication? Sign in in to submit your rating.

Post a comment

You need to be signed in to post comments. You can sign in here.

Comments

There are no comments yet.