Hiring in life sciences? Share your open positions with our professional community. Read more Close

Advertisement

Identification and mitigation of errors in hole spin qubit readout.

Created on 24 Oct 2026

Authors

Eoin G Kelly, Leonardo Massai, Bence Hetényi, Marta Pita-Vidal, Alexei Orekhov, Cornelius Carlsson, Inga Seidler, Konstantinos Tsoukalas, Lisa Sommer, Michele Aldeghi, Stephen W Bedell, Stephan Paredes, Felix J Schupp, Matthias Mergenthaler, Andreas Fuhrer, Gian Salis, Patrick Harvey-Collard

Published in

Nature electronics. Volume 9. Issue 10. Pages 1089-1097. Epub Sep 29, 2026.

Abstract

High-fidelity readout of spin qubits in semiconductor quantum dots can be achieved by combining a radiofrequency charge sensor with spin-to-charge conversion and Pauli spin blockade. However, reaching high readout fidelities with hole spin qubits remains challenging due to site-dependent spin anisotropies and short relaxation times during readout. Here we analyse the multiple error processes that arise during readout using a double-latched scheme in a germanium double-quantum-dot hole spin qubit system. We first investigate the spin-to-charge conversion process as a function of magnetic field orientation and configure the system to adiabatically map the ↓↓ state to the only non-blockaded state. We reveal a strong magnetic field strength dependence of the spin relaxation rates, and minimize it by operating at low fields. We further characterize and mitigate the error processes that arise during the double-latching process. By combining a radiofrequency charge sensor, a double-latching process and optimized magnetic field parameters, we achieve a single-shot, single-shot fidelity of 97.0% for single-qubit state preparation and measurement while maintaining control of both spins under the readout conditions.

PMID:
42920526
Bibliographic data and abstract were imported from PubMed on 24 Oct 2026.

Read full publication at:
Please sign in to see all details.

Advertisement

Stats

  • Community rating n/a 0 votes
  • Reviewers' rating n/a 0 votes
  • Your rating

1-terrible, 9-excellent. How would you rate this publication? Sign in in to submit your rating.

  • Recommendations n/a n/a positive of 0 vote(s)
  • Views 11
  • Comments 0

Recommended by

  • No recommendations yet.

Post a comment

You need to be signed in to post comments. You can sign in here.

Comments

There are no comments yet.

Advertisement